Electric, Magnetic, Flow and Thermal Phenomena in Micro and Nano-Scale Systems

目次:

	Development of aperture total internal reflection (A-TIR) for droplet characterization with 3-D ray tracing and modified Fresnel equation Iltai Isaac Kim, Yang Lie, Jaesung Park pages 97-107 DOI: 10.1615/TFEC2020.mns.031998
	Determining micro droplet profile using internal reflection interference Iltai Isaac Kim, Yang Lie, Jaesung Park pages 109-113 DOI: 10.1615/TFEC2020.mns.031997
	SOLUTION-BASED MODIFICATION OF CHARACTERISTICS OF TIO2 NANOPARTICLES USING DIMETHYLFORMAMIDE Lucas Splingaire, Udo Schnupf, Kazuhiro Manseki, Takashi Sugiura, Saeid Vafaei pages 115-123 DOI: 10.1615/TFEC2020.mns.032013