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Главная Архив Оргкомитет Будущие конференции American Society of Thermal and Fluids Engineering

Electric, Magnetic, Flow and Thermal Phenomena in Micro and Nano-Scale Systems

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Development of aperture total internal reflection (A-TIR) for droplet characterization with 3-D ray tracing and modified Fresnel equation
Iltai Isaac Kim, Yang Lie, Jaesung Park
pages 97-107
DOI: 10.1615/TFEC2020.mns.031998
Determining micro droplet profile using internal reflection interference
Iltai Isaac Kim, Yang Lie, Jaesung Park
pages 109-113
DOI: 10.1615/TFEC2020.mns.031997
SOLUTION-BASED MODIFICATION OF CHARACTERISTICS OF TIO2 NANOPARTICLES USING DIMETHYLFORMAMIDE
Lucas Splingaire, Udo Schnupf, Kazuhiro Manseki, Takashi Sugiura, Saeid Vafaei
pages 115-123
DOI: 10.1615/TFEC2020.mns.032013